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White paper

24.08.2021 | 3094x

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The easy way to correlation between sieve analysis and image analysis

This white paper describes how Dynamic Image Analysis can effectively replace sieve analysis and significantly reduce the user’s workload.

Sieve analysis is still a standard method for routine determination of particle size distributions of powders and granulates. On the one hand, it is cost-efficient and apparently easily executed, but on the other hand, it is also prone to error and flawed by various inaccuracies. The time required for one analysis may add up to 15 -30 minutes, including weighing, sieving process and cleaning. The information gained is limited as the number of data points is defined by the number of available test sieves. In contrast, DIA delivers a high-resolution measurement result within 2 - 3 minutes which contains additional information on particle shape and is generated automatically.

Not surprisingly, some systematic differences can be observed in the results generated by different measurement techniques. In this article, these systematic differences are discussed for DIA and sieve analysis using application examples with various materials and particle shapes. Finally, we present possible solutions how to overcome these deviations and how to establish a robust and reliable correlation of DIA and sieve data.

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Particle shape measurement, grain shape measurement,; Particle shape laboratory testing, Particle shape process control, Laboratory testing, Particle Size, Particle Shape, Process control Up to date information and background information about Particle shape analysis, and companies active in this field. Most information is supplied by companies, so you are sure this info is relevant and practical.

The easy way to correlation between sieve analysis and image analysis

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