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09.02.2017  |  13183x
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White Paper Comparison of Particle Analysis Methods

Sieve Analysis - Laser Diffraction - Dynamic Image Analysis

Different measuring techniques provide different results – but what is the truth? The most common techniques to determine the particle size distribution are dynamic image analysis (DIA), static laser light scatter-ing (SLS, also called laser diffraction) and sieve analysis. <b>This white paper presents the advantages and drawbacks of each technique, their comparability among each other as well as detailed application examples. </b>

Each method covers a characteristic size range within which measurement is possible and which partly overlap. The three methods discussed here, for example, all measure particles in a range from 1 μm to 5 mm. However, the results for measuring the same sample can vary considerably.

This white paper will help to interpret the informative value and significance of particle analysis results and to decide which method is best suited for a particular application.

<b>Download</b>:

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