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Product news
08.10.2015  |  4056x
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NEW: XRD-Mill McCrone from RETSCH

Rapid Particle Size Reduction for X-Ray Diffraction

RETSCH have enhanced their comprehensive range of mills and grinders with the XRD-Mill McCrone which was specifically developed for sample preparation to X-Ray diffraction analysis. Typical areas of application include geology, chemistry, mineralogy and materials science.

What makes this mill so effective is the unique grinding action: the grinding jar contains 48 cylinders which pulverize the sample very gently by friction. As a result the crystal lattice structure of the sample is largely preserved which is an important precondition for obtaining meaningful X-ray diffractograms. Further advantages are short grinding times, virtually no sample loss and exceptionally narrow particle size distributions.

The grinding vessel consists of a 125 ml polypropylene jar fitted with a screw-capped polyethylene closure. The jar is packed with an ordered array of forty-eight identical cylindrical grinding elements which are available in agate, zirconium oxide or sintered corundum. For optimum micronization the mill is operated for periods of 3 to 30 minutes; the recommended sample volume is 2 to 4 ml.


Benefits at a glance:

  • Crystal lattice structure of sample is preserved
  • Minimum sample contamination
  • Narrow, reproducible particle size distribution
  • Compact bench-top model
  • Easy cleaning
  • Suitable for dry and wet grinding

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